Difference between revisions of "VonGraevenitz Wagner Harhoff (2011) - How To Measure Patent Thickets A Novel Approach"

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|Has article title=How To Measure Patent Thickets A Novel Approach
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|Has author=VonGraevenitz Wagner Harhoff
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*This page is referenced in the [[Patent Thicket Literature Review]]
 
*This page is referenced in the [[Patent Thicket Literature Review]]

Latest revision as of 19:15, 29 September 2020

Article
Has bibtex key
Has article title How To Measure Patent Thickets A Novel Approach
Has author VonGraevenitz Wagner Harhoff
Has year 2011
In journal
In volume
In number
Has pages
Has publisher
© edegan.com, 2016


Reference

  • Von Graevenitz, G., Wagner, S. and Harhoff, D. (2011), "How to measure patent thickets -; A novel approach", Economics Letters, Vol.111, No.1, pp.6--9
@article{von2011measure,
  title={How to measure patent thickets -- A novel approach},
  author={Von Graevenitz, G. and Wagner, S. and Harhoff, D.},
  journal={Economics Letters},
  volume={111},
  number={1},
  pages={6--9},
  year={2011},
  abstract={This paper provides a direct measure of the density of patent thickets based on patent citations. We discuss the algorithm that generates the measure and present descriptive results validating it. Moreover, we identify technology areas particularly affected by patent thickets.},
  discipline={Econ},
  research_type={Measures},
  industry={},
  thicket_stance={},
  thicket_stance_extract={},
  thicket_def={},
  thicket_def_extract={},  
  tags={},
  filename={VonGraevenitz Wagner Harhoff (2011) - How To Measure Patent Thickets  A Novel Approach.pdf}
}

File(s)

Abstract

This paper provides a direct measure of the density of patent thickets based on patent citations. We discuss the algorithm that generates the measure and present descriptive results validating it. Moreover, we identify technology areas particularly affected by patent thickets.