Edit Article: VonGraevenitz Wagner Harhoff (2011) - How To Measure Patent Thickets A Novel Approach

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*This page is referenced in the [[Patent Thicket Literature Review]] *This page is listed on the [[PTLR Core Papers]] page ==Reference== *Von Graevenitz, G., Wagner, S. and Harhoff, D. (2011), "How to measure patent thickets -; A novel approach", Economics Letters, Vol.111, No.1, pp.6--9 @article{von2011measure, title={How to measure patent thickets -- A novel approach}, author={Von Graevenitz, G. and Wagner, S. and Harhoff, D.}, journal={Economics Letters}, volume={111}, number={1}, pages={6--9}, year={2011}, abstract={This paper provides a direct measure of the density of patent thickets based on patent citations. We discuss the algorithm that generates the measure and present descriptive results validating it. Moreover, we identify technology areas particularly affected by patent thickets.}, discipline={Econ}, research_type={Measures}, industry={}, thicket_stance={}, thicket_stance_extract={}, thicket_def={}, thicket_def_extract={}, tags={}, filename={VonGraevenitz Wagner Harhoff (2011) - How To Measure Patent Thickets A Novel Approach.pdf} } ==File(s)== *[[Media:VonGraevenitz Wagner Harhoff (2011) - How To Measure Patent Thickets A Novel Approach.pdf|Download the PDF]] *[[:Image:VonGraevenitz Wagner Harhoff (2011) - How To Measure Patent Thickets A Novel Approach.pdf|Repository record]] ==Abstract== This paper provides a direct measure of the density of patent thickets based on patent citations. We discuss the algorithm that generates the measure and present descriptive results validating it. Moreover, we identify technology areas particularly affected by patent thickets.

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